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Help Direct export Save to Mendeley Save to RefWorks Export file Format RIS (for EndNote, ReferenceManager, ProCite) BibTeX Text Content Citation Only Citation and Abstract Export Advanced search Close This document Please enable JavaScript to use all the features on this page. This paper presents a BER tester implementation based on the Altera Stratix II GX and IV GT development boards. Please try the request again.

Back to Top 2. Thanks Reply With Quote July 30th, 2014,08:41 AM #4 [email protected] View Profile View Forum Posts Altera Guru Join Date Aug 2005 Location California Posts 4,511 Rep Power 1 Re: Design of Implementing the GBT data transmission protocol in FPGA. This sets up the device to compare expected data to actual in real time.

Figure 4: External connections on the NI PXI-6552 for synchronization To perform the test, the stimulus data (loaded on the on-board memory), is generated, and the expected data is stored in Stratix IV GXGT development platform, HTG-S4G-PCIE user manual. [6] D. Did you get the VHDL sources you mentioned in your first post of these thread? I certainly wouldn't argue with the option of having more I/O channels for future expansion but that is all I need at the moment.

Your cache administrator is webmaster. The architecture of the tester is described. The versatile link, a common project for super-LHC. First, the Digital Waveform Editor (DWE) must be used to create the stimulus data.

Step 4: To set up hardware compare on the digital board, property nodes are used for both the acquisition and generation sessions. Register now for a free account in order to: Sign in to various IEEE sites with a single account Manage your membership Get member discounts Personalize your experience Manage your profile ScienceDirect ® is a registered trademark of Elsevier B.V.RELX Group Close overlay Close Sign in using your ScienceDirect credentials Username: Password: Remember me Not Registered? An example of a semiconductor device for which a BERT test would be useful is a deserializer or SerDes.

I use an optical master (SFP module) to drive the optical input of the transceiver and measure the BER of the electrical output. The system returned: (22) Invalid argument The remote host or network may be down. Home Forum New Posts FAQ Calendar Community Groups Forum Actions Mark Forums Read Quick Links Today's Posts View Site Leaders Forum Rules Marketplace Shared Material FAQ About Us Register Chinese Forum http://www.nallatech.com/PCI-Express...ting-card.html http://gidel.com/ProceV.html * SFP/SFP+ ports http://www.bittware.com/products-ser...a5-pcie-l-a5pl http://www.bittware.com/products-ser...are/s5-pcie-hq http://www.bittware.com/products-ser...are/s5-pcie-ds * QSFP+ ports * Bitware has several other products like this too http://www.terasic.com.tw/cgi-bin/pa...No=13&No=&~123 * Terasic have several boards with QSFP+ or SFP+ connectors

I'm currently using the transceivers on several development kits, so if you can describe your application, I might be able to suggest an appropriate kit. On the generation side the sample clock must be exported to the ClkOut pin on the Digital Data and Control Connector (DDC) by connecting the ClkOut pin on the Digital Data Your cache administrator is webmaster. Proceedings TWEPP 2009 http://cdsweb.cern.ch/record/1235860/files/p471.pdf9. [2] L.

By cjansen in forum General Altera Discussion Replies: 8 Last Post: February 9th, 2009, 05:52 PM Design consideration help - Memory tester By KWolfe in forum General Discussion Forum Replies: 6 The system returned: (22) Invalid argument The remote host or network may be down. Reply With Quote January 20th, 2016,06:48 PM #8 [email protected] View Profile View Forum Posts Altera Guru Join Date Aug 2005 Location California Posts 4,511 Rep Power 1 Re: Design of an To set up the hardware for testing the DUT, configure one of the 32 bidirectional pins on the NI PXI-6552 high-speed digital board as an output.

The Stratix II GX tester was also used in a proton test on a custom designed serializer chip to record and analyse radiation-induced errors. Keywords Front-end electronics; bit error rate; FPGA; Deserializers take in serial digital data and output parallel data based on the serial input. The Hardware Compare Mode is set to "Stimulus and Expected Response". Please try the request again.

The test can be modified for different types of device under tests (DUTs). Some external connections need to be made to synchronize the generation and acquisition sessions. Copyright © 2012 Published by Elsevier B.V. The acquired data is compared to the expected data to check for errors.

Then the appropriate Hierarchical Waveform Storage (HWS) file containing the stimulus data is chosen on the front panel of the attached LabVIEW virtual instrument (VI). Generated Fri, 14 Oct 2016 12:37:00 GMT by s_ac4 (squid/3.5.20) ERROR The requested URL could not be retrieved The following error was encountered while trying to retrieve the URL: http://0.0.0.8/ Connection Choose your country Australia Brasil Canada (English) Canada (Français) Deutschland España France India Italia Magyarország Malaysia México Nederland Österreich Polska Schweiz Singapore Suisse Sverige United Kingdom United States Российская Федерация 中国 Lesezeichen / Weitersagen Share Downloads Attachments: digital_bert_test.vi Bewertung(en) Dieses Dokument bewerten Bewerten 1 - Schlecht 2 3 4 5 - Ausgezeichnet Wurde Ihre Frage beantwortet?

or its licensors or contributors. An external connection also needs to be made between the lines PFI1 and PFI2 on the DDC. The receiver compares the actual response from the DUT with the expected response which is provided by the user. A use case of a deserializer would be for acquiring signals of speeds higher than the capabilities of existing hardware.

Back to Top 5. Generated Fri, 14 Oct 2016 12:37:00 GMT by s_ac4 (squid/3.5.20) ERROR The requested URL could not be retrieved The following error was encountered while trying to retrieve the URL: http://0.0.0.10/ Connection http://cdsweb.cern.ch/record/1236361/files/p631.pdf. [4] Altera.